Resonance Raman Scattering: Nondestructive and Noninvasive Technique for Structural and Electronic Characterization of Isolated Single-Wall Carbon Nanotubes

نویسندگان

  • A. Jorio
  • F. M. Matinaga
  • A. Righi
  • M. S. S. Dantas
  • M. A. Pimenta
  • A. G. Souza Filho
  • J. Mendes Filho
  • J. H. Hafner
  • C. M. Lieber
  • R. Saito
  • G. Dresselhaus
  • M. S. Dresselhaus
چکیده

A. Jorio, F. M. Matinaga, A. Righi, M. S. S. Dantas, M. A. Pimenta, A. G. Souza Filho, J. Mendes Filho, J. H. Hafner, C. M. Lieber, R. Saito, G. Dresselhaus , and M. S. Dresselhaus Departamento de F sica, Universidade Federal de Minas Gerais, Belo Horizonte, MG, 30123-970 Brazil Departamento de F sica, Universidade Federal do Cear a, Fortaleza-CE, 60455-760, Brazil Department of Chemistry, Harvard University, Cambridge, MA 02138 USA Department of Electronic-Engineering, University of Electro-Communications, Tokyo, 182-8585 Japan Department of Physics, Francis Bitter Magnet Laboratory, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology,

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تاریخ انتشار 2002